Force measurement with a piezoelectric cantilever in a scanning force microscope
نویسندگان
چکیده
منابع مشابه
Scanned-cantilever atomic force microscope
We have developed a 3.6 pm scan range atomic force microscope that scans the cantilever instead of the sample, while the optical-lever detection apparatus remains stationary. The design permits simpler, more adaptable sample mounting, and generally improves ease of use. Software workarounds alleviate the minor effects of spurious signal variations that arise as a result of scanning the cantilev...
متن کاملSensitivity of an Atomic Force Microscope Cantilever with a Crack
The atomic force microscope (AFM) has become an essential tool for the measurement of surface characteristics of diverse materials on a microand nanoscale level [1]. The resolution of measurements for the AFM cantilever is related to its vibration sensitivity. Many researchers have much interest in studying the resonant frequency and sensitivity analysis of AFM cantilevers [2 4]. Cracks may be ...
متن کاملModelling and H1 force control of a nonlinear piezoelectric cantilever
During a micromanipulation, it is important to have the same performances whatever the manipulated object is. We present in this paper the control of the force applied to flexible and rigid micro-objects by a piezoelectric cantilever. First, the voltage-force transfer function is modeled. The hysteresis and creep phenomena are taken into account. The reliance of the model on the characteristics...
متن کاملSensitivity analysis of a caliper formed atomic force microscope cantilever based on a modified couple stress theory
A relationship based on the modified couple stress theory is developed to investigate the flexural sensitivity of an atomic force microscope (AFM) with assembled cantilever probe (ACP). This ACP comprises a horizontal cantilever, two vertical extensions and two tips located at the free ends of the extensions which form a caliper. An approximate solution to the flexural vibration problem is obta...
متن کاملSensitivity analysis of a caliper formed atomic force microscope cantilever based on a modified couple stress theory
A relationship based on the modified couple stress theory is developed to investigate the flexural sensitivity of an atomic force microscope (AFM) with assembled cantilever probe (ACP). This ACP comprises a horizontal cantilever, two vertical extensions and two tips located at the free ends of the extensions which form a caliper. An approximate solution to the flexural vibration problem is obta...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: Ultramicroscopy
سال: 1992
ISSN: 0304-3991
DOI: 10.1016/0304-3991(92)90467-x